BibTeX record conf/ats/OhtakeIF97

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@inproceedings{DBLP:conf/ats/OhtakeIF97,
  author       = {Satoshi Ohtake and
                  Tomoo Inoue and
                  Hideo Fujiwara},
  title        = {Sequential Test Generation Based on Circuit Pseudo-Transformation},
  booktitle    = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
                  Japan},
  pages        = {62--67},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/ATS.1997.643919},
  doi          = {10.1109/ATS.1997.643919},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/OhtakeIF97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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