BibTeX record conf/ats/LeeTLL09

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@inproceedings{DBLP:conf/ats/LeeTLL09,
  author       = {Lung{-}Jen Lee and
                  Wang{-}Dauh Tseng and
                  Rung{-}Bin Lin and
                  Chen{-}Lun Lee},
  title        = {A Multi-dimensional Pattern Run-Length Method for Test Data Compression},
  booktitle    = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
                  November 2009, Taichung, Taiwan},
  pages        = {325--330},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/ATS.2009.49},
  doi          = {10.1109/ATS.2009.49},
  timestamp    = {Fri, 24 Mar 2023 00:02:33 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/LeeTLL09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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