BibTeX record conf/ats/GuarnieriFC12

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@inproceedings{DBLP:conf/ats/GuarnieriFC12,
  author       = {Valerio Guarnieri and
                  Franco Fummi and
                  Krishnendu Chakrabarty},
  title        = {Reduced-Complexity Transition-Fault Test Generation for Non-scan Circuits
                  through High-Level Mutant Injection},
  booktitle    = {21st {IEEE} Asian Test Symposium, {ATS} 2012, Niigata, Japan, November
                  19-22, 2012},
  pages        = {302--307},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/ATS.2012.47},
  doi          = {10.1109/ATS.2012.47},
  timestamp    = {Fri, 24 Mar 2023 00:02:34 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/GuarnieriFC12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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