BibTeX record conf/ats/GoelGMPR11

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@inproceedings{DBLP:conf/ats/GoelGMPR11,
  author    = {Ashish Goel and
               Swaroop Ghosh and
               Mesut Meterelliyoz and
               Jeff Parkhurst and
               Kaushik Roy},
  title     = {Integrated Design {\&} Test: Conquering the Conflicting Requirements
               of Low-Power, Variation-Tolerance and Test Cost},
  booktitle = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
               Delhi, India, November 20-23, 2011},
  pages     = {486--491},
  year      = {2011},
  crossref  = {DBLP:conf/ats/2011},
  url       = {https://doi.org/10.1109/ATS.2011.100},
  doi       = {10.1109/ATS.2011.100},
  timestamp = {Thu, 25 May 2017 00:41:53 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ats/GoelGMPR11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/2011,
  title     = {Proceedings of the 20th {IEEE} Asian Test Symposium, {ATS} 2011, New
               Delhi, India, November 20-23, 2011},
  publisher = {{IEEE} Computer Society},
  year      = {2011},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6114262},
  isbn      = {978-1-4577-1984-4},
  timestamp = {Thu, 14 Jan 2016 10:14:00 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/ats/2011},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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