BibTeX record conf/aspdac/XieWX12

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@inproceedings{DBLP:conf/aspdac/XieWX12,
  author       = {Jing Xie and
                  Yu Wang and
                  Yuan Xie},
  title        = {Yield-aware time-efficient testing and self-fixing design for TSV-based
                  3D ICs},
  booktitle    = {Proceedings of the 17th Asia and South Pacific Design Automation Conference,
                  {ASP-DAC} 2012, Sydney, Australia, January 30 - February 2, 2012},
  pages        = {738--743},
  publisher    = {{IEEE}},
  year         = {2012},
  url          = {https://doi.org/10.1109/ASPDAC.2012.6165053},
  doi          = {10.1109/ASPDAC.2012.6165053},
  timestamp    = {Fri, 07 Feb 2020 04:46:08 +0100},
  biburl       = {https://dblp.org/rec/conf/aspdac/XieWX12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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