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BibTeX record conf/aspdac/XieWX12
@inproceedings{DBLP:conf/aspdac/XieWX12, author = {Jing Xie and Yu Wang and Yuan Xie}, title = {Yield-aware time-efficient testing and self-fixing design for TSV-based 3D ICs}, booktitle = {Proceedings of the 17th Asia and South Pacific Design Automation Conference, {ASP-DAC} 2012, Sydney, Australia, January 30 - February 2, 2012}, pages = {738--743}, publisher = {{IEEE}}, year = {2012}, url = {https://doi.org/10.1109/ASPDAC.2012.6165053}, doi = {10.1109/ASPDAC.2012.6165053}, timestamp = {Fri, 07 Feb 2020 04:46:08 +0100}, biburl = {https://dblp.org/rec/conf/aspdac/XieWX12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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