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BibTeX record conf/aiccsa/El-MalehAM08
@inproceedings{DBLP:conf/aiccsa/El-MalehAM08, author = {Aiman H. El{-}Maleh and Bashir M. Al{-}Hashimi and Aissa Melouki}, title = {Transistor-level based defect tolerance for reliable nanoelectronics}, booktitle = {The 6th {ACS/IEEE} International Conference on Computer Systems and Applications, {AICCSA} 2008, Doha, Qatar, March 31 - April 4, 2008}, pages = {53--60}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/AICCSA.2008.4493516}, doi = {10.1109/AICCSA.2008.4493516}, timestamp = {Fri, 24 Mar 2023 00:02:05 +0100}, biburl = {https://dblp.org/rec/conf/aiccsa/El-MalehAM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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