BibTeX record conf/IEEEares/MayerS17

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@inproceedings{DBLP:conf/IEEEares/MayerS17,
  author       = {Felix Mayer and
                  Martin Steinebach},
  title        = {Forensic Image Inspection Assisted by Deep Learning},
  booktitle    = {Proceedings of the 12th International Conference on Availability,
                  Reliability and Security, Reggio Calabria, Italy, August 29 - September
                  01, 2017},
  pages        = {53:1--53:9},
  publisher    = {{ACM}},
  year         = {2017},
  url          = {https://doi.org/10.1145/3098954.3104051},
  doi          = {10.1145/3098954.3104051},
  timestamp    = {Tue, 06 Nov 2018 16:58:04 +0100},
  biburl       = {https://dblp.org/rec/conf/IEEEares/MayerS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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