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ORCIDXiang Fu 0007
Person information
- affiliation: Chinese Academy and Sciences, Institute of Computing Technology, Key Laboratory of Computer System and Architecture, Beijing, China
Other persons with the same name
- Xiang Fu — disambiguation page
- Xiang Fu 0001 — Hofstra University, Department of Computer Science, Hempstead, NY, USA (and 2 more)
- Xiang Fu 0002
![[0000-0002-9690-2302]](https://dblp.uni-trier.de/img/orcid-mark.12x12.png "0000-0002-9690-2302")
— National University of Defense Technology, College of Computer, Key Laboratory of Software Engineering for Complex Systems, Changsha, China (and 2 more) - Xiang Fu 0003 — National University of Defense Technology, College of Computer, Institute for Quantum Information & State Key Laboratory of High Performance Computing (HPCL), Changsha, China (and 1 more)
- Xiang Fu 0004 — Nanchang Hangkong University, School of Software, Nanchang, China (and 1 more)
- Xiang Fu 0005 — Massachusetts Institute of Technology, Computer Science and Artificial Intelligence Laboratory, Cambridge, MA, USA (and 1 more)
- Xiang Fu 0006 — University of Southern California, Department of Electrical Engineering, Los Angeles, CA, USA
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Journal Articles
- 2012
[j2]Xiang Fu, Huawei Li, Xiaowei Li:
Testable Path Selection and Grouping for Faster Than At-Speed Testing. IEEE Trans. Very Large Scale Integr. Syst. 20(2): 236-247 (2012)- 2010
- [j1]Xiang Fu, Huawei Li, Xiaowei Li:
Testable Critical Path Selection Considering Process Variation. IEICE Trans. Inf. Syst. 93-D(1): 59-67 (2010)
Conference and Workshop Papers
- 2010
- [c4]Xiang Fu, Huawei Li, Xiaowei Li:
On Selection of Testable Paths with Specified Lengths for Faster-Than-At-Speed Testing. Asian Test Symposium 2010: 45-48 - 2008
- [c3]Yu Hu, Xiang Fu, Xiaoxin Fan, Hideo Fujiwara:
Localized random access scan: Towards low area and routing overhead. ASP-DAC 2008: 565-570 - [c2]Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li:
Robust test generation for power supply noise induced path delay faults. ASP-DAC 2008: 659-662 - 2007
- [c1]Da Wang, Xiaoxin Fan, Xiang Fu, Hui Liu, Ke Wen, Rui Li, Huawei Li, Yu Hu, Xiaowei Li:
The design-for-testability features of a general purpose microprocessor. ITC 2007: 1-9
Coauthor Index
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