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Per-Otto Hetland

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Journal Articles

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2003
[j2]
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  dblp key:
  - journals/tim/BehrKJKWDLPHREHJCHBSANH03
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  - https://dblp.org/rec/journals/tim/BehrKJKWDLPHREHJCHBSANH03
Ralf Behr, Johannes Kohlmann, Theodoor J. B. M. Janssen, Peter Kleinschmidt, Jonathan M. Williams, Sophie Djordjevic, Jean-Pierre Lo-Hive, François P. M. Piquemal, Per-Otto Hetland, Dominique Reymann, Gunnar Eklund, Christian Hof, Blaise Jeanneret, Oleg A. Chevtchenko, Ernest Houtzager, Helko E. van den Brom, Andrea Sosso, Domenico Andreone, Jaani Nissilä, Panu Helistö:
Analysis of different measurement setups for a programmable Josephson voltage standard. IEEE Trans. Instrum. Meas. 52(2): 524-528 (2003)
2001
[j1]
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Bernd Schumacher, Peter Warnecke, Wilfrid Poirier, I. Delgado, Z. Msimang, Giorgio Boella, Per-Otto Hetland, Randolph E. Elmquist, Jonathan M. Williams, David Inglis, Beat Jeckelmann, Ove Gunnarsson, Alexandre Satrapinski:
Transport behavior of commercially available 100-Ω standard resistors. IEEE Trans. Instrum. Meas. 50(2): 242-244 (2001)

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