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Sam-jin Hwang

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2000 – 2009

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2008
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Jung-Eun Seok, Hyun-Joo Kim, Jae-Yong Seo, Sam-jin Hwang, Byung-Heon Kwak:
Optimization of gate poly TAB size and reliability on short channel pMOSFET. Microelectron. Reliab. 48(8-9): 1185-1188 (2008)

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