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Louis Medina
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2020 – today
- 2021
- [c4]Yusheng Bian, Colleen Meagher, Karen Nummy, Sujith Chandran, Won Suk Lee, Abdelsalam Aboketaf, Danhao Ma, Ryan Sporer, Michal Rakowski, Nuh Yuksek, Monica Esopi, Bo Peng, Yangyang Liu, Abu Thomas, Tymon Barwicz, Takako Hirokawa, Javier Ayala, Asli Sahin, Andy Stricker, Subramanian Krishnamurthy, Shuren Hu, Zoey Sowinski, Kate McLean, Louis Medina, Kevin Dezfulian, Michelle Zhang, Mona Nafari, Zhuoqiang Jia, Kaushikee Mishra, Asif Chowdhury, Francis Afzal, Brendan Harris, Salman Mosleh, Bruna Paredes, Marcus Dahlem, Jaime Viegas, Rod Augur, Dave Riggs, Luke Lee, Wenhe Lin, Ajey P. Jacob, Fen Jamin, Mai Randall, Hemanth Parsa, Vikas Gupta, Anthony Yu, Ken Giewont, Ted Letavic, John Pellerin:
Monolithically integrated silicon nitride platform. OFC 2021: 1-3 - [c3]Yusheng Bian, Koushik Ramachandran, Bo Peng, Brittany Hedrick, Scott Mills, Keith Donegan, Armand Rundquist, Ed Vail, Vaishnavi Karra, Firat Yasar, Monica Esopi, Benjamin Fasano, Asli Sahin, Thomas Houghton, Karen Nummy, Hanyi Ding, Takako Hirokawa, Kevin Dezfulian, Zhuo-Jie Wu, Daniel Fisher, Jim Pape, Jay Steffes, Louis Medina, Subharup Gupta Roy, Harry Cox, Bart Green, Jorge Lubguban, Won Suk Lee, Abdelsalam Aboketaf, Michal Rakowski, Kate McLean, Zoey Sowinski, Oh-Jung Kwon, Gabrielle Robert, Massimo Sorbara, Subramanian Krishnamurthy, Andy Stricker, Jae Kyu Cho, Ian Melville, Dave Riggs, Rod Augur, Norman Robson, Daniel Berger, Luke Lee, Vikas Gupta, Anthony Yu, Ken Giewont, Ted Letavic, John Pellerin:
Hybrid III-V laser integration on a monolithic silicon photonic platform. OFC 2021: 1-3 - 2020
- [c2]Michal Rakowski, Colleen Meagher, Karen Nummy, Abdelsalam Aboketaf, Javier Ayala, Yusheng Bian, Brendan Harris, Kate McLean, Kevin McStay, Asli Sahin, Louis Medina, Bo Peng, Zoey Sowinski, Andy Stricker, Thomas Houghton, Crystal Hedges, Ken Giewont, Ajey P. Jacob, Ted Letavic, Dave Riggs, Anthony Yu, John Pellerin:
45nm CMOS - Silicon Photonics Monolithic Technology (45CLO) for Next-Generation, Low Power and High Speed Optical Interconnects. OFC 2020: 1-3
2010 – 2019
- 2010
- [c1]Raphael Robertazzi, Louis Medina, Ernesto Shiling, Garry Moore, Ronald Geiger, Jiun-Hsin Liao, John Williamson:
New tools and methodology for advanced parametric and defect structure test. ITC 2010: 19-28
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