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2020 – today
- 2024
[j4]Manoj Stanley
, Martin J. Salter, Jonas Urbonas, James Skinner, Sang-Hee Shin, Sebastian De Graaf, Nick M. Ridler:
Characterizing S-Parameters of Microwave Coaxial Devices With up to Four Ports at Temperatures of 3 K and Above for Quantum Computing Applications. IEEE Trans. Instrum. Meas. 73: 1-6 (2024)- [c3]Lewis Manning, Martin J. Salter, Martin Wickham, Ana Robador, Osman Sibonjic, Sani Sarcevic, Semir Cohodarevic, Giovanni Betta, Domenico Capriglione, Gianfranco Miele:
S-Parameter Analysis of Age Testing Effects on FR4-Based Printed Circuit Boards up to 10 GHz. M&N 2024: 1-6 - [c2]Dilbagh Singh, Martin J. Salter, Nick M. Ridler:
Characterisation of Power Transistors for Wireless Network Applications Using Passive and Active Load-Pull. M&N 2024: 1-5 - 2022
- [j3]Dilbagh Singh, Martin J. Salter, Susan Johny, Nick M. Ridler:
Uncertainties in Small-Signal and Large-Signal Measurements of RF Amplifiers Using a VNA. IEEE Instrum. Meas. Mag. 25(6): 37-44 (2022) - [c1]Djamel Allal, R. Bannister, Koen Buisman, Domenico Capriglione, Giulia Di Capua, Martín García-Patrón, Thomas Gatzweiler, Frauke Gellersen, Thomas Harzheim, Holger Heuermann, Johannes Hoffmann, A. Izbrodin, Karsten Kuhlmann, Khitem Lahbacha, Antonio Maffucci, Gianfranco Miele, Faisal Ali Mubarak, Martin J. Salter, Thi Dao Pham, Ahmed Sayegh, Dilbagh Singh, Friederike Stein, Markus Zeier:
RF Measurements for Future Communication Applications: an Overview. M&N 2022: 1-6
2000 – 2009
- 2003
- [j2]Maurice G. Cox, Mark P. Dainton, Nick M. Ridler, Martin J. Salter, P. R. Young:
An interpolation scheme for precision intermediate frequency reflection coefficient measurement. IEEE Trans. Instrum. Meas. 52(1): 27-37 (2003) - [j1]Andrew G. Morgan, Nick M. Ridler, Martin J. Salter:
Generalized adaptive calibration schemes for precision RF vector network analyzer measurements. IEEE Trans. Instrum. Meas. 52(4): 1266-1272 (2003)
Coauthor Index
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