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K. T. Hjelt

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2000 – 2009

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2000
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L. R. Van den Doel, Lucas J. van Vliet, K. T. Hjelt, Michael J. Vellekoop, Ian T. Young, F. Gromball, Jan G. Korvink:
Nanometer-Scale Height Measurements in Micromachined Picoliter Vials Based on Interference Fringe Analysis. ICPR 2000: 3057-3062

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