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Jiri Balcarek

Jirí Balcárek

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2010 – 2019

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2014
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Jirí Balcárek, Petr Fiser, Jan Schmidt:
On don't cares in test compression. Microprocess. Microsystems 38(8): 754-765 (2014)
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Petr Fiser, Jan Schmidt, Jiri Balcarek:
Sources of bias in EDA tools and its influence. DDECS 2014: 258-261
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Jan Schmidt, Petr Fiser, Jiri Balcarek:
On Robustness of EDA Tools. DSD 2014: 427-434
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Jiri Balcarek, Petr Fiser, Jan Schmidt:
PBO-Based Test Compression. DSD 2014: 679-682
2013
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Jiri Balcarek, Petr Fiser, Jan Schmidt:
Techniques for SAT-based constrained test pattern generation. Microprocess. Microsystems 37(2): 185-195 (2013)
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Jan Schmidt, Petr Fiser, Jiri Balcarek:
The influence of implementation type on dependability parameters. Microprocess. Microsystems 37(6-7): 641-648 (2013)
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Jiri Balcarek, Petr Fiser, Jan Schmidt:
Simulation and SAT Based ATPG for Compressed Test Generation. DSD 2013: 445-452
2012
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Jan Schmidt, Petr Fiser, Jiri Balcarek:
The Influence of Implementation Technology on Dependability Parameters. DSD 2012: 368-373
2011
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Jiri Balcarek, Petr Fiser, Jan Schmidt:
Techniques for SAT-Based Constrained Test Pattern Generation. DSD 2011: 360-366
2010
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Jiri Balcarek, Petr Fiser, Jan Schmidt:
Test Patterns Compression Technique Based on a Dedicated SAT-Based ATPG. DSD 2010: 805-808

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