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C. Sie

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1980 – 1989

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1981
[c1]
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  - https://dblp.org/rec/conf/itc/DunnKRSS81
Robert G. Dunn, A. Kwan, David P. Rodgers, D. Sandstrom, C. Sie:
System to Optimize Test Quality and Efficiency for Memories and LSI. ITC 1981: 31-37

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