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M. Nagatani

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1980 – 1989

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1986
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Norio Kuji, Teruo Tamama, M. Nagatani:
FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(2): 313-319 (1986)

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