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Journal Articles
- 2022
[j6]Ajai Jain, Avichal Jain:
An approach for optimisation of flexible flow shop group scheduling with sequence dependent set-up time and preventive maintenance. Int. J. Comput. Aided Eng. Technol. 16(1): 40-66 (2022)- 2020
- [j5]Viraj Tyagi, Ajai Jain, P. K. Jain:
An integrated approach for multi-period manufacturing planning of job-shops. Int. J. Manuf. Res. 15(2): 148-180 (2020) - 2016
- [j4]Pankaj Sharma, Ajai Jain:
New setup-oriented dispatching rules for a stochastic dynamic job shop manufacturing system with sequence-dependent setup times. Concurr. Eng. Res. Appl. 24(1): 58-68 (2016) - 2013
- [j3]Rakesh Kumar Phanden
, Ajai Jain, Rajiv Verma:
An approach for integration of process planning and scheduling. Int. J. Comput. Integr. Manuf. 26(4): 284-302 (2013) - 2012
- [j2]Sanjeev Kumar Garg, Alakesh Manna, Ajai Jain:
Experimental Investigation of Machining Characteristics for the WEDM of Al/ZrO2(p)-PRMMC. Int. J. Manuf. Mater. Mech. Eng. 2(4): 32-46 (2012) - 2011
- [j1]Rakesh Kumar Phanden, Ajai Jain, Rajiv Verma:
Integration of process planning and scheduling: a state-of-the-art review. Int. J. Comput. Integr. Manuf. 24(6): 517-534 (2011)
Conference and Workshop Papers
- 2003
- [c5]Aditya Kapoor, Kush Arora, Ajai Jain, G. P. Kapoor:
Stochastic Image Compression Using Fractals. ITCC 2003: 574- - 1998
- [c4]V. Rajesh, Ajai Jain:
Automatic Test Pattern Generation for Sequential Circuits Using Genetic Algorithms. VLSI Design 1998: 270-273 - [c3]Amey Karkare, Manoj Singla, Ajai Jain:
Testability Preserving and Enhancing Transformations for Robust Delay Fault Testabilit. VLSI Design 1998: 370-373 - 1996
- [c2]Dhruva R. Chakrabarti, Ajai Jain:
An Efficient Test Generation Technique for Sequential Circuits with Repetitive Sub-Circuits. VLSI Design 1996: 174-177 - 1995
- [c1]Dhruva R. Chakrabarti, Ajai Jain:
An improved hierarchical test generation technique for combinational circuits with repetitive sub-circuits. Asian Test Symposium 1995: 237-243
Coauthor Index
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