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Cees J. van Mullem

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Journal Articles

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2001
[j5]
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  - journals/tim/FilipskiMJKKLW01
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Piotr S. Filipski, Cees J. van Mullem, David Janik, Manfred Klonz, Joseph R. Kinard, Thomas E. Lipe, Bryan C. Waltrip:
Comparison of high-frequency AC-DC voltage transfer standards at NRC, VSL, PTB, and NIST. IEEE Trans. Instrum. Meas. 50(2): 349-352 (2001)
[j4]
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Reinoud F. Wolffenbuttel, Cees J. van Mullem:
Guest editorial. IEEE Trans. Instrum. Meas. 50(6): 1467-1468 (2001)
[j3]
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Reinoud F. Wolffenbuttel, Cees J. van Mullem:
The relationship between microsystem technology and metrology. IEEE Trans. Instrum. Meas. 50(6): 1469-1474 (2001)
[j2]
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  - journals/tim/GraafBXMW01
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Ger de Graaf, Marian Bartek, Zhixiong Xiao, Cees J. van Mullem, Reinoud F. Wolffenbuttel:
Bulk micromachined electrostatic RMS-to-DC converter. IEEE Trans. Instrum. Meas. 50(6): 1508-1512 (2001)
1999
[j1]
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Cees J. van Mullem:
CCE 92-05 intercomparison of ac-dc voltage transfer standards at high frequencies (1-50 MHz). IEEE Trans. Instrum. Meas. 48(2): 154-157 (1999)

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