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J. F. W. Schiz

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2001
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Andrew C. Lamb, J. F. W. Schiz, J. M. Bonar, Fuccio Cristiano, Peter Ashburn, Stephen Hall, Peter L. F. Hemment:
Characterisation of emitter/base leakage currents in SiGe HBTs produced using selective epitaxy. Microelectron. Reliab. 41(2): 273-279 (2001)

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