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R. G. Southwick III

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2008
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D. Estrada, M. L. Ogas, R. G. Southwick III, P. M. Price, R. J. Baker, W. B. Knowlton:
Impact of single pMOSFET dielectric degradation on NAND circuit performance. Microelectron. Reliab. 48(3): 354-363 (2008)

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