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ORCIDRandolph E. Elmquist
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Journal Articles
- 2023
[j17]Dean G. Jarrett
, Ching-Chen Yeh, Shamith U. Payagala, Alireza R. Panna, Yanfei Yang, Linli Meng, Swapnil M. Mhatre, Ngoc Thanh Mai Tran, Heather M. Hill, Dipanjan Saha, Randolph E. Elmquist, David B. Newell, Albert F. Rigosi:
Graphene-Based Star-Mesh Resistance Networks. IEEE Trans. Instrum. Meas. 72: 1-10 (2023)- 2020
- [j16]Takehiko Oe, Albert F. Rigosi, Mattias Kruskopf, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Randolph E. Elmquist, Nobu-hisa Kaneko, Dean G. Jarrett:
Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices. IEEE Trans. Instrum. Meas. 69(6): 3103-3108 (2020) - [j15]Shamith U. Payagala, Albert F. Rigosi, Alireza R. Panna, Alessio Pollarolo, Mattias Kruskopf, Stephan Schlamminger, Dean G. Jarrett, Ryan Brown, Randolph E. Elmquist, Duane Brown, David B. Newell:
Comparison Between Graphene and GaAs Quantized Hall Devices With a Dual Probe. IEEE Trans. Instrum. Meas. 69(12): 9374-9380 (2020) - 2019
- [j14]Stephan Schlamminger, Patrick Abbott, Zeina Kubarych, Dean G. Jarrett, Randolph E. Elmquist:
The units for mass, voltage, resistance, and electrical current in the SI. IEEE Instrum. Meas. Mag. 22(3): 9-16 (2019) - [j13]Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, Mattias Kruskopf, Marlin Kraft, George R. Jones, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Jiuning Hu, Dean G. Jarrett, David B. Newell, Randolph E. Elmquist:
Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards. IEEE Trans. Instrum. Meas. 68(6): 1870-1878 (2019) - 2015
- [j12]Yasuhiro Fukuyama, Randolph E. Elmquist, Lung-I Huang, Yanfei Yang, Fan-Hung Liu, Nobu-hisa Kaneko:
Controlling the Fermi Level in a Single-Layer Graphene QHE Device for Resistance Standard. IEEE Trans. Instrum. Meas. 64(6): 1451-1454 (2015) - [j11]Nobu-hisa Kaneko, Takehiko Oe, Wan-Seop Kim, Dong-Hun Chae, Randolph E. Elmquist, Marlin Kraft:
Transportation Effect and Basic Characteristics of Metal-Foil Resistors Examined in an International Trilateral Pilot Study. IEEE Trans. Instrum. Meas. 64(6): 1514-1519 (2015) - 2013
- [j10]Mariano A. Real, Eric A. Lass, Fan-Hung Liu, Tian Shen, George R. Jones, Johannes A. Soons, David B. Newell, Albert V. Davydov, Randolph E. Elmquist:
Graphene Epitaxial Growth on SiC(0001) for Resistance Standards. IEEE Trans. Instrum. Meas. 62(6): 1454-1460 (2013) - [j9]Gert Rietveld, Jan H. N. van der Beek, Marlin Kraft, Randolph E. Elmquist, Alessandro Mortara, Beat Jeckelmann:
Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior. IEEE Trans. Instrum. Meas. 62(6): 1723-1728 (2013) - 2009
- [j8]M. E. Bierzychudek, Randolph E. Elmquist:
Uncertainty Evaluation in a Two-Terminal Cryogenic Current Comparator. IEEE Trans. Instrum. Meas. 58(4): 1170-1175 (2009) - [j7]Dean G. Jarrett, Randolph E. Elmquist, Nien Fan Zhang, Alejandra Tonina, Marta Porfiri, Janice de Brito Fernandes, Helio Schechter, Daniel Izquierdo, Carlos Faverio, Daniel Slomovitz, David Inglis, Kai Wendler, Felipe Hernandez Marquez, Benjamín Rodríguez Medina:
SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ. IEEE Trans. Instrum. Meas. 58(4): 1188-1195 (2009) - 2005
- [j6]Randolph E. Elmquist, Emmanouel Hourdakis, Dean G. Jarrett, Neil M. Zimmerman:
Direct resistance comparisons from the QHR to100 MΩ using a cryogenic current comparator. IEEE Trans. Instrum. Meas. 54(2): 525-528 (2005) - 2003
- [j5]Randolph E. Elmquist, Neil M. Zimmerman, William H. Huber:
Using a high-value resistor in triangle comparisons of electrical standards. IEEE Trans. Instrum. Meas. 52(2): 590-593 (2003) - 2001
- [j4]Bernd Schumacher, Peter Warnecke, Wilfrid Poirier, I. Delgado, Z. Msimang, Giorgio Boella, Per-Otto Hetland, Randolph E. Elmquist, Jonathan M. Williams, David Inglis, Beat Jeckelmann, Ove Gunnarsson, Alexandre Satrapinski:
Transport behavior of commercially available 100-Ω standard resistors. IEEE Trans. Instrum. Meas. 50(2): 242-244 (2001) - [j3]Randolph E. Elmquist, Anne-Marie Jeffery, Dean G. Jarrett:
Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory. IEEE Trans. Instrum. Meas. 50(2): 267-271 (2001) - 2000
- [j2]Randolph E. Elmquist:
Calculable coaxial resistors for precision measurements. IEEE Trans. Instrum. Meas. 49(2): 210-215 (2000) - 1999
- [j1]Randolph E. Elmquist:
Cryogenic current comparator measurements at 77 K using thallium-2223 thick-film shields. IEEE Trans. Instrum. Meas. 48(2): 383-386 (1999)
Coauthor Index
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