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Philip C. Canfield

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2000 – 2009

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2001
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Peter Dai, Philip C. Canfield:
Location of defective cells in HBT power amplifier arrays using IR emission microscopy. Microelectron. Reliab. 41(8): 1137-1141 (2001)

1990 – 1999

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1990
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Philip C. Canfield, Steven C. F. Lam, David J. Allstot:
Modeling of frequency and temperature effects in GaAs MESFETs. IEEE J. Solid State Circuits 25(1): 299-306 (1990)
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Philip C. Canfield, David J. Allstot:
A p-well GaAs MESFET technology for mixed-mode applications. IEEE J. Solid State Circuits 25(6): 1544-1549 (1990)

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