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John S. Batchelder

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1980 – 1989

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1988
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Byron Dom, Virginia H. Brecher, Raymond Bonner, John S. Batchelder, Robert S. Jaffe:
The P300: A system for automatic patterned wafer inspection. Mach. Vis. Appl. 1(4): 205-221 (1988)
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Byron Dom, Virginia H. Brecher, Raymond Bonner, John S. Batchelder, Robert S. Jaffe:
Errata. Mach. Vis. Appl. 2(1): 65 (1988)

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