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Journal Articles
- 2023
[j21]Stephan Schlamminger
, Andrew D. Koffman, James W. Schmidt, Bryan C. Waltrip, Yicheng Wang:
Measurement of the Frequency Dependence of Four Terminal-Pair Air Capacitors With a Vector Network Analyzer. IEEE Trans. Instrum. Meas. 72: 1-10 (2023)- 2022
- [j20]Mona Feige, Stephan Schlamminger, Andrew D. Koffman, Dean G. Jarrett, Shamith U. Payagala, Alireza R. Panna, Bryan C. Waltrip, Mike Berilla, Frank Seifert, Yicheng Wang:
Comparison of a 100-pF Capacitor With a 12 906-Ω Resistor Using a Digital Impedance Bridge. IEEE Trans. Instrum. Meas. 71: 1-7 (2022) - 2021
- [j19]Bryan C. Waltrip, Thomas L. Nelson, Mike Berilla, Nathan E. Flowers-Jacobs, Paul D. Dresselhaus:
Comparison of AC Power Referenced to Either PJVS or JAWS. IEEE Trans. Instrum. Meas. 70: 1-6 (2021) - 2019
- [j18]Bryan C. Waltrip, Shannon Edwards, Tom L. Nelson, Mike Berilla:
A Sampling Wattmeter With Extended Frequency Range. IEEE Trans. Instrum. Meas. 68(6): 2187-2194 (2019) - 2017
- [j17]Bryan C. Waltrip, Frank Seifert:
A Programmable Capacitor for Inductance Measurements. IEEE Trans. Instrum. Meas. 66(6): 1572-1578 (2017) - 2015
- [j16]Bryan C. Waltrip, Thomas L. Nelson, Eddy So, David Angelo:
A Comparison Between the NIST PJVS-Based Power Standard and the NRC Current- Comparator-Based Power Standard. IEEE Trans. Instrum. Meas. 64(1): 14-18 (2015) - [j15]Bryan C. Waltrip, Owen B. Laug, Thomas L. Nelson:
A 600 V AC Voltage Amplifier for Power Measurements. IEEE Trans. Instrum. Meas. 64(6): 1373-1377 (2015) - 2009
- [j14]Alain Rüfenacht, Charles J. Burroughs Jr., Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson:
Precision Differential Sampling Measurements of Low-Frequency Synthesized Sine Waves With an AC Programmable Josephson Voltage Standard. IEEE Trans. Instrum. Meas. 58(4): 809-815 (2009) - [j13]Bryan C. Waltrip, Bo Gong, Thomas L. Nelson, Yicheng Wang, Charles J. Burroughs Jr., Alain Rüfenacht, Samuel P. Benz, Paul D. Dresselhaus:
AC Power Standard Using a Programmable Josephson Voltage Standard. IEEE Trans. Instrum. Meas. 58(4): 1041-1048 (2009) - 2008
- [j12]Charles J. Burroughs Jr., Alain Rüfenacht, Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson:
Error and Transient Analysis of Stepwise-Approximated Sine Waves Generated by Programmable Josephson Voltage Standards. IEEE Trans. Instrum. Meas. 57(7): 1322-1329 (2008) - 2007
- [j11]Charles J. Burroughs Jr., Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson, Yonuk Chong, Jonathan M. Williams, Dale Henderson, Pravin Patel, Luis Palafox, Ralf Behr:
Development of a 60 Hz Power Standard Using SNS Programmable Josephson Voltage Standards. IEEE Trans. Instrum. Meas. 56(2): 289-294 (2007) - [j10]Svetlana Avramov-Zamurovic, Andrew D. Koffman, Bryan C. Waltrip, Yicheng Wang:
Evaluation of a Capacitance Scaling System. IEEE Trans. Instrum. Meas. 56(6): 2160-2163 (2007) - 2005
- [j9]Eddy So, Dave Angelo, Takuhiro Tsuchiyama, Takuya Tadokoro, Bryan C. Waltrip, Tom L. Nelson:
Intercomparison of calibration systems for AC shunts up to audio frequencies. IEEE Trans. Instrum. Meas. 54(2): 507-511 (2005) - 2003
- [j8]Eddy So, Réjean Arseneau, David Bennett, Thomas L. Nelson, Bryan C. Waltrip:
NRC-NIST intercomparison of calibration systems for current transducers with a voltage output at power frequencies. IEEE Trans. Instrum. Meas. 52(2): 424-428 (2003) - [j7]David I. Bergman, Bryan C. Waltrip:
A low-noise latching comparator probe for waveform sampling applications. IEEE Trans. Instrum. Meas. 52(4): 1107-1113 (2003) - 2001
- [j6]Piotr S. Filipski, Cees J. van Mullem, David Janik, Manfred Klonz, Joseph R. Kinard, Thomas E. Lipe, Bryan C. Waltrip:
Comparison of high-frequency AC-DC voltage transfer standards at NRC, VSL, PTB, and NIST. IEEE Trans. Instrum. Meas. 50(2): 349-352 (2001) - [j5]Gerard N. Stenbakken, Dong Liu, Janusz A. Starzyk, Bryan C. Waltrip:
Nonrandom quantization errors in timebases. IEEE Trans. Instrum. Meas. 50(4): 888-892 (2001) - [j4]Bryan C. Waltrip, Owen B. Laug, Gerard N. Stenbakken:
Improved time-base for waveform parameter estimation. IEEE Trans. Instrum. Meas. 50(4): 981-985 (2001) - 2000
- [j3]Andrew D. Koffman, Svetlana Avramov-Zamurovic, Bryan Cristopher Waltrip, Nile M. Oldham:
Uncertainty analysis for four terminal-pair capacitance and dissipation factor characterization at 1 and 10 MHz. IEEE Trans. Instrum. Meas. 49(2): 346-348 (2000) - [j2]Svetlana Avramov-Zamurovic, Andrew D. Koffman, Nile M. Oldham, Bryan Cristopher Waltrip:
The sensitivity of a method to predict a capacitor's frequency characteristic. IEEE Trans. Instrum. Meas. 49(2): 398-404 (2000) - 1998
- [j1]Svetlana Avramov-Zamurovic, Nile M. Oldham, Mark E. Parker, Bryan Christopher Waltrip:
Low-frequency characteristics of thin-film multijunction thermal voltage converters. IEEE Trans. Instrum. Meas. 47(1): 87-89 (1998)
Conference and Workshop Papers
- 2004
- [c1]David I. Bergman, Bryan C. Waltrip:
Low thermal error sampling comparator for accurate settling measurements. ISCAS (1) 2004: 521-524
Coauthor Index
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