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M. P. Rodgers

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2007
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Daniel M. Fleetwood, M. P. Rodgers, L. Tsetseris, X. J. Zhou, I. Batyrev, S. Wang, Ronald D. Schrimpf, Sokrates T. Pantelides:
Effects of device aging on microelectronics radiation response and reliability. Microelectron. Reliab. 47(7): 1075-1085 (2007)

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