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Amit M. Sheth

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affiliation: New Jersey Institute of Technology, Newark, NJ, USA

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2000 – 2009

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2004
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Amit M. Sheth, Jacob Savir:
Scan Latch Design for Test Applications. J. Electron. Test. 20(2): 213-216 (2004)
2003
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Amit M. Sheth, Jacob Savir:
Single-clock, single-latch, scan design. IEEE Trans. Instrum. Meas. 52(5): 1455-1457 (2003)

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