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Venkata A. R. Gurram

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2025
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Suriyaprakash Natarajan, Chaitali S. Oak, Nipun Chaplot, Vijay Kakollu, Venkata A. R. Gurram, Manish J. Mishra, Fayez Abu-gosh:
DRONE: Delay Defect and Marginality Targeted Scan Tests to Observe Insidious Errors. ITC 2025: 253-261

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