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Rajarshi Ray 0002

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affiliation: Object Recognition Systems, Inc., Princeton, NJ, USA

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1980 – 1989

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1989
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Rajarshi Ray:
Automated inspection of solder bumps using visual signatures of specular image-highlights. CVPR 1989: 588-596
1983
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Rajarshi Ray, John R. Birk, Robert B. Kelley:
Error Analysis of Surface Normals Determined by Radiometry. IEEE Trans. Pattern Anal. Mach. Intell. 5(6): 631-645 (1983)

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