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Tsvetanka Zheleva

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2010 – 2019

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2011
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Jungwoo Joh, Jesús A. del Alamo, Kurt Langworthy, Sujing Xie, Tsvetanka Zheleva:
Role of stress voltage on structural degradation of GaN high-electron-mobility transistors. Microelectron. Reliab. 51(2): 201-206 (2011)

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