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Remo G. Markgraf

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Journal Articles

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1992
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  - journals/tcad/SarfertMST92
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  - https://dblp.org/rec/journals/tcad/SarfertMST92
Thomas M. Sarfert, Remo G. Markgraf, Michael H. Schulz, Erwin Trischler:
A hierarchical test pattern generation system based on high-level primitives. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(1): 34-44 (1992)

Conference and Workshop Papers

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1989
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Thomas M. Sarfert, Remo G. Markgraf, Erwin Trischler, Michael H. Schulz:
Hierarchical Test Pattern Generation Based on High-Level Primitives. ITC 1989: 470-479

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