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C. Cazzaniga

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2025
[c1]
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K. Niskanen, Arto Javanainen, Heikki Kettunen, C. Cazzaniga, M. Kastriotou, C. Frost:
Gate Current Stress for Detecting Neutron-Induced Degradation in SiC Power MOSFETs. IRPS 2025: 1-5

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