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M. L. Meyerson

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2025
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B. D. Rummel, C. E. Glaser, J. A. Ohlhausen, J. P. Klesko, M. L. Meyerson, C. Remple, R. J. Kaplar:
Interfacial GaOx in $\text{Al}_{2}\mathrm{O}_{3}/n-\text{GaN}$ MOS Structures Studied by Quasi-Static CV and ToF-SIMS. IRPS 2025: 1-10

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