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A. Rhellab

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2024
[c1]
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Olivier Occello, Marc Margalef-Rovira, Manuel J. Barragan Asian, C. Durand, A. Rhellab, L. Vincent, J. Corsi, Sylvie Lépilliet, G. Ducournau, P. Ferrari:
Zero-Overhead Nonintrusive Test of mmW Integrated Circuits Based on Wafer-Level Parametric Tests. NewCAS 2024: 79-83

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