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John Berech

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2000 – 2009

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2002
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Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech:
Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC 2002: 1120-1129

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