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Frank Böhland

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1990 – 1999

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1994
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Arno Kunzmann, Frank Böhland:
Self-test of sequential circuits with deterministic test pattern sequences. J. Electron. Test. 5(2-3): 307-312 (1994)
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Arno Kunzmann, Frank Böhland:
Gate-Delay Fault Test with Conventional Scan-Design. EDAC-ETC-EUROASIC 1994: 524-528

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