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ORCIDLiang Pang 0002
Person information
- affiliation: Southeast University, National ASIC Center, Nanjing, China
- affiliation: National Center of Technology Innovation for EDA, Nanjing, China
Other persons with the same name
- Liang Pang — disambiguation page
- Liang Pang 0001
![[0000-0003-1161-8546]](https://dblp.uni-trier.de/img/orcid-mark.12x12.png "0000-0003-1161-8546")
— Chinese Academy of Sciences, Institute of Computing Technology, Beijing, China (and 1 more) - Liang Pang 0003 — Shanghai Jiao Tong University, School of Electronic Information and Electrical Engineering, Shanghai, China
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2020 – today
- 2025
[j5]Kaijie Li, Liang Pang, Xudong Zhang, Yutao Miao, Yushi Zhang:
Efficient high dimensional yield analysis for SRAM circuits via stack model and adaptive sampling. Integr. 104: 102477 (2025)- 2024
- [j4]Ziqi Wang, Liang Pang, Xiao Shi, Longxing Shi:
Efficient Memory Circuits Yield Analysis and Optimization Framework via Meta-Learning. IEEE Trans. Circuits Syst. II Express Briefs 71(9): 4196-4200 (2024) - 2023
- [j3]Liang Pang, Ziqi Wang, Rui Shi, Mengyun Yao, Xiao Shi, Hao Yan, Longxin Shi:
An efficient SRAM yield analysis method based on scaled-sigma adaptive importance sampling with meta-model accelerated. Integr. 89: 155-167 (2023) - [j2]Liang Pang, Mengyun Yao, Xiao Shi, Hao Yan, Longxin Shi:
CharTM: The dynamic stability characterization for memory based on tail distribution modeling. Microelectron. J. 133: 105697 (2023) - 2021
- [j1]Liang Pang, Shan Shen, Mengyun Yao:
A Spline-High Dimensional Model Representation for SRAM Yield Estimation in High Sigma and High Dimensional Scenarios. IEEE Access 9: 47320-47329 (2021) - 2020
- [c3]Shan Shen, Liang Pang, Tianxiang Shao, Ming Ling, Xiao Shi, Longxing Shi:
TYMER: A Yield-based Performance Model for Timing-speculation SRAM. DAC 2020: 1-6 - [c2]Liang Pang, Mengyun Yao, Yifan Chai:
An Efficient SRAM yield Analysis Using Scaled-Sigma Adaptive Importance Sampling. DATE 2020: 97-102
2010 – 2019
- 2019
- [c1]Liang Pang, Yifan Chai, Mengyun Yao, Yaqing Men, Xuexiang Wang, Longxing Shi:
An Accurate and Efficient Yield Analysis for SRAM dynamic metrics Using Differential Evolution Algorithm. ASICON 2019: 1-4
Coauthor Index
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