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Daniel Crozier

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2023
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Dipankar Sen, Alma Fernández, Daniel Crozier, Brian Henrich, Alexei V. Sokolov, Marlan O. Scully, William L. Rooney, Aart J. Verhoef:
Non-Destructive Direct Pericarp Thickness Measurement of Sorghum Kernels Using Extended-Focus Optical Coherence Microscopy. Sensors 23(2): 707 (2023)

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