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Jongsoo Yim

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2000 – 2009

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2008
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Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang:
A Prevenient Voltage Stress Test Method for High Density Memory. DELTA 2008: 516-520

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