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Nadun Sinhabahu

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Conference and Workshop Papers

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2023
[c3]
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Nadun Sinhabahu, Katherine Shu-Min Li, Sying-Jyan Wang, J. R. Wang, Matt Ho:
Machine-Learning Driven Sensor Data Analytics for Yield Enhancement of Wafer Probing. ITC 2023: 93-98
2022
[c2]
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Nadun Sinhabahu, Jian-De Li, Katherine Shu-Min Li, Sying-Jyan Wang, Tsung-Yi Ho:
Trojan Insertions of Fully Programmable Valve Arrays. ETS 2022: 1-2
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Nadun Sinhabahu, Katherine Shu-Min Li, Jian-De Li, J. R. Wang, Sying-Jyan Wang:
Yield-Enhanced Probe Head Cleaning with AI-Driven Image and Signal Integrity Pattern Recognition for Wafer Test. ITC 2022: 554-558

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