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M. Sagawa

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Conference and Workshop Papers

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2022
[c2]
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  - conf/irps/MikiSMMKAO22
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Hiroshi Miki, M. Sagawa, Y. Mori, T. Murata, K. Kinoshita, K. Asaka, T. Oda:
Accurate screening of defective oxide on SiC using consecutive multiple threshold-voltage measurements. IRPS 2022: 8
2015
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Koichiro Adachi, Takanori Suzuki, T. Ohtoshi, K. Nakahara, M. Sagawa, Akira Nakanishi, Kazuhiko Naoe, Shigehisa Tanak:
Facet-free surface-emitting 1.3-μm DFB laser. ECOC 2015: 1-3

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