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Thomas M. M. Heenan

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2022
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  - electronic edition @ arxiv.org (open access)
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  - journals/corr/abs-2202-09572
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Adam M. Boyce, Emilio Martínez-Pañeda, Aaron Wade, Ye Shui Zhang, Josh J. Bailey, Thomas M. M. Heenan, Dan J. L. Brett, Paul R. Shearing:
Cracking predictions of lithium-ion battery electrodes by X-ray computed tomography and modelling. CoRR abs/2202.09572 (2022)

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