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J. P. Guerveno

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2003
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P. Charpenel, F. Davenel, R. Digout, M. Giraudeau, M. Glade, J. P. Guerveno, N. Guillet, A. Lauriac, S. Male, D. Manteigas:
The right way to assess electronic system reliability: FIDES. Microelectron. Reliab. 43(9-11): 1401-1404 (2003)

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