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Jim-Woo Yun

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2010 – 2019

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2014
[c1]
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Jim-Woo Yun, Heon Gu, Dae-Hwan Kim, Hoi-Sik Moon, Sung-Jea Ko:
Automatic mura inspection using the principal component analysis for the TFT-LCD panel. ICCE-TW 2014: 109-110

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