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ORCIDHiroshi Uemura
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2020 – today
- 2023
[c6]Hiroshi Uemura, Taichi Misawa, Naoki Itabashi, Munetaka Kurokawa, Yoshiyuki Sugimoto, Seiji Kumagai, Masaru Takechi, Keiji Tanaka:
A 19-dB Peaking at 72-GHz and 4.1-Vppd Output Swing SiGe BiCMOS Linear Driver with Dynamic Cascode Output Buffer. BCICTS 2023: 159-162- [c5]Seiji Kumagai, Yoshiyuki Sugimoto, Hiroshi Uemura, Munetaka Kurokawa, Naoki Itabashi, Masaru Takechi, Takuya Okimoto, Keiji Tanaka:
A Shunt-Feedback TIA with Common-Base Variable Gain Input Stage for 128-GBaud Coherent Communication. BCICTS 2023: 163-166 - [c4]Yasutaka Mizuno, Munetaka Kurokawa, Naoki Itabashi, Taichi Misawa, Masaru Takechi, Hiroshi Uemura, Hajime Tanaka, Tsutomu Ishikawa, Tomoya Saeki, Keiji Tanaka, Takatoshi Kato, Manabu Shiozaki, Katsumi Uesaka:
Low Insertion Loss 128-Gbaud HB-CDM with 3D-Printed Spot Size Converter Integrated InP-based Modulator. OFC 2023: 1-3 - 2021
- [c3]Munetaka Kurokawa, Kenichi Nakayama, Masaru Takechi, Yasutaka Mizuno, Taichi Misawa, Eiichi Banno, Hiroshi Uemura, Yoshiyuki Sugimoto, Seiji Kumagai, Takuya Okimoto, Naoya Kono, Tsutomu Ishikawa, Hiroshi Hara, Takatoshi Kato, Keiji Tanaka, Mitsuru Ekawa, Katsumi Uesaka:
High Optical Output Power and High-responsivity IC-TROSA for 800 Gbps applications. ECOC 2021: 1-3
2010 – 2019
- 2016
- [j2]Hiroshi Uemura, Yoichiro Kurita, Hideto Furuyama:
12.5 Gb/s Optical Driver and Receiver ICs With Double-Threshold AGC for SATA Out-of-Band Transmission. IEEE J. Solid State Circuits 51(7): 1641-1650 (2016) - 2015
- [c2]Hiroshi Uemura, Yoichiro Kurita, Hideto Furuyama:
12.5Gb/s optical driver and receiver ICs with double threshold AGC for SATA Out-of-Band transmission. ESSCIRC 2015: 52-55 - 2011
- [c1]Ippei Akita
, Yuta Tsubouchi, Tetsuro Itakura, Michihiko Nishigaki, Hiroshi Uemura, Hideto Furuyama, Hideki Shibata:
A 6Gbps 3mW optical receiver with DCOC-combined ATC in 65nm CMOS. ESSCIRC 2011: 343-346
2000 – 2009
- 2007
- [j1]Hideyuki Ichihara, Toshimasa Kuchii, Masaaki Yamadate, Hideaki Sakaguchi, Hiroshi Uemura, Kozo Kinoshita:
A statistical error model for image sensors and its testing. Syst. Comput. Jpn. 38(11): 1-11 (2007)
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