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W. A. Kuo

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2018
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S. E. Liu, G. Y. Chen, M. K. Chen, David Yen, W. A. Kuo, C. S. Fu, Y. S. Tsai, M. Z. Lin, Y. H. Fang, M. J. Lin:
Fast chip aging prediction by product-like VMIN drift characterization on test structures. IRPS 2018: 3

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