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Dae-Chan Kim

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Journal Articles

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2015
[j5]
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  - https://dblp.org/rec/journals/tim/ChoLKK15
Chihyun Cho, Joo-Gwang Lee, Jeong-Hwan Kim, Dae-Chan Kim:
Uncertainty Analysis in EVM Measurement Using a Monte Carlo Simulation. IEEE Trans. Instrum. Meas. 64(6): 1413-1418 (2015)
2011
[j4]
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Tae-Weon Kang, Jeong-Hwan Kim, Joo-Gwang Lee, Jeong-Il Park, Dae-Chan Kim:
Determining Noise Temperature of a Noise Source Using Calibrated Noise Sources and an RF Attenuator. IEEE Trans. Instrum. Meas. 60(7): 2558-2563 (2011)
2009
[j3]
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No-Weon Kang, Jin-Seob Kang, Dae-Chan Kim, Jeong-Hwan Kim, Joo-Gwang Lee:
Characterization Method of Electric Field Probe by Using Transfer Standard in GTEM Cell. IEEE Trans. Instrum. Meas. 58(4): 1109-1113 (2009)
2007
[j2]
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No-Weon Kang, Jin-Seob Kang, Dae-Chan Kim, Jeong-Hwan Kim:
Fabrication of Small Reference Probe and Its Application. IEEE Trans. Instrum. Meas. 56(2): 435-438 (2007)
2005
[j1]
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Jin-Seob Kang, Jeong-Hwan Kim, Dae-Chan Kim:
Phase analysis of coaxial short and open circuits. IEEE Trans. Instrum. Meas. 54(2): 701-704 (2005)

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