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Raphaël Clerc
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2020 – today
- 2023
- [c11]Vincent Duveiller, Arthur Gautheron, Anthony Cazier, Lionel Simonot, Raphaël Clerc, Jean-Pierre Salomon, Mathieu Hébert:
Estimation of the fluorescence emission spectrum of dental composite resin samples of varying thickness. Color Imaging: Displaying, Processing, Hardcopy, and Applications 2023: 190:1-190:7 - 2022
- [c10]Arthur Gautheron, Raphaël Clerc, Vincent Duveiller, Lionel Simonot, Bruno Montcel, Mathieu Hébert:
Light scattering in translucent layers: angular distribution and internal reflections at flat interfaces. Color Imaging: Displaying, Processing, Hardcopy, and Applications 2022: 221:1-221:6 - [c9]Vincent Duveiller, Emmanuel Kim, Marie Locquet, Arthur Gautheron, Raphaël Clerc, Jean-Pierre Salomon:
Predictions of the Reflectance Factor of Translucen Layered Dental Resin Composites Using Two-Flux Models: assessing the importance of the interface reflectance parameter. CVCS 2022 - [c8]Dorian Saint-Pierre, Raphaël Clerc, Rémi Helleboid, Denis Rideau:
On the convergence of the recurrence solution of McIntyre's local and non-local avalanche triggering probability equations for SPAD compact models. ESSDERC 2022: 277-280 - 2020
- [c7]Vincent Duveiller, Lou Gevaux, Raphaël Clerc, Jean-Pierre Salomon, Mathieu Hébert:
Reflectance and transmittance of flowable dental resin composite predicted by the two-flux model: on the importance of analyzing the effective measurement geometry. CIC 2020: 313-320
2010 – 2019
- 2019
- [c6]Tulio Chaves de Albuquerque, Dylan Issartel, Raphael Clerc, Patrick Pittet, Remy Cellier, Wilfried Uhring, Andreia Cathelin, Françis Calmon:
Body-biasing considerations with SPAD FDSOI: advantages and drawbacks. ESSDERC 2019: 210-213 - 2018
- [c5]Lou Gevaux, Cyprien Adnet, Pierre Séroul, Raphael Clerc, Alain Trémeau, Jean-Luc Perrot, Mathieu Hébert:
Three-dimensional hyperspectral imaging: a new method for human face acquisition. Material Appearance 2018: 1-10 - [c4]Tulio Chaves de Albuquerque, Françis Calmon, Raphael Clerc, Patrick Pittet, Younes Benhammou, Dominique Golanski, Sebastien Jouan, Denis Rideau, Andreia Cathelin:
Integration of SPAD in 28nm FDSOI CMOS technology. ESSDERC 2018: 82-85 - [c3]Raphael Clerc, Jérôme Vaillant, Lionel Hirsch:
Device modeling of solution-processed organic solar cells, photodiodes and photo-resistances Invited paper. ESSDERC 2018: 198-201 - 2017
- [c2]Pierre Séroul, Mathieu Hébert, Marie Cherel, Romain Vernet, Raphael Clerc, Matthieu Jomier:
Model-based Skin Pigment Cartography by High-Resolution Hyperspectral Imaging. Material Appearance 2017: 108-114
2000 – 2009
- 2009
- [c1]Emanuela Buccafurri, Abdelkrim Medjahdi, Françis Calmon, Raphael Clerc, Marco Pala, A. Poncet, Gérard Ghibaudo:
Challenges and prospects of RF oscillators using silicon resonant tunneling diodes. ESSCIRC 2009: 220-223 - 2001
- [j2]P. O'Sullivan, Raphael Clerc, Kevin G. McCarthy, Alan Mathewson, Gérard Ghibaudo:
Direct tunnelling models for circuit simulation. Microelectron. Reliab. 41(7): 951-957 (2001) - [j1]Raphael Clerc, Alessandro S. Spinelli, Gérard Ghibaudo, Charles Leroux, G. Pananakakis:
Electrical characterization and quantum modeling of MOS capacitors with ultra-thin oxides (1.4-3 nm). Microelectron. Reliab. 41(7): 1027-1030 (2001)
Coauthor Index
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