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W. Breuer

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2018
[j1]
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  - https://dblp.org/rec/journals/mr/SchaffusABDGHKM18
T. Schaffus, P. Albert, W. Breuer, D. Debie, M. Graml, C. Hollerith, F. Kroninger, W. Mack, H. Pfaff, M. Schaffus, J. Walter:
Influence of sample preparation on intrinsic stresses inside a model Chip - First results of partial decapsulation. Microelectron. Reliab. 88-90: 299-303 (2018)

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