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Vladimir Chepelev

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2020
[j2]
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  - journals/et/ParfenovCCX20
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  - https://dblp.org/rec/journals/et/ParfenovCCX20
Yury Parfenov, Vladimir Chepelev, Yuhao Chen, Yan-zhao Xie:
Role of the Pulse Repetition Rate when Assessing Electromagnetic Immunity of Electronic Devices. J. Electron. Test. 36(5): 671-676 (2020)
2018
[j1]
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  - journals/et/ChepelevPRTZLCK18
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Vladimir Chepelev, Yury Parfenov, William Radasky, Boris Titov, Leonid Zdoukhov, Kejie Li, Yuhao Chen, Xu Kong, Yan-zhao Xie:
Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP. J. Electron. Test. 34(5): 547-557 (2018)

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