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Rafael Moreno-Vallecillo

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2007
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Mark Holden, Rafael Moreno-Vallecillo, Anthony W. F. Harris, Lavier J. Gomes, Than-Mei Diep, Pierrick T. Bourgeat, Sébastien Ourselin:
Expectation maximization classification and Laplacian based thickness measurement for cerebral cortex thickness estimation. Medical Imaging: Image Processing 2007: 65120M

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